Correlation between microstructure and optical transparency of PLD-derived nanostructured La₂O₃

Authors

  • Hussian Fakhry Applied Sciences Department, University of Technology- Iraq, Baghdad 10066, Iraq Author
  • Mohammed RASHEED Production Engineering & Metallurgy College, University of Technology- Iraq, Baghdad, Iraq Author
  • Odai N. Salman Applied Sciences Department, University of Technology- Iraq, Baghdad 10066, Iraq Author
  • Raid A. Ismail Applied Sciences Department, University of Technology- Iraq, Baghdad 10066, Iraq Author

DOI:

https://doi.org/10.56053/10.1.81

Keywords:

La2O3 NPs, FESEM, XRD

Abstract

Lanthanum oxide (La₂O₃) thin films were synthesized using the pulsed laser deposition (PLD) method to explore their potential in optoelectronic device applications. High-purity La₂O₃ pellets were fabricated by palletisation with polyvinyl alcohol (PVA) as a binder and subsequently sintered to enhance mechanical strength. The deposition is carried out using a Nd:YAG laser (λ = 532 nm, 1000 mJ, 6 Hz) onto fluorine-doped tin oxide (FTO) substrates under a vacuum pressure of 10⁻² torr. Post-growth analyses included X-ray diffraction (XRD) to determine the crystalline structure, atomic force microscopy (AFM) for surface topography, Fourier-transform infrared spectroscopy (FTIR) and the vibrational characteristics of the La₂O₃ films were examined using Raman spectroscopy, and their optical response, including absorption and transmittance behaviour, is evaluated through UV–Vis spectroscopic analysis. Results confirmed the formation of polycrystalline films with homogeneous grain distribution and minimal surface roughness. Optical absorption studies demonstrated high transparency in the visible spectrum and revealed a direct band gap energy of 3.80 eV highlighting the suitability of La₂O₃ thin films for optoelectronic and photonic applications.

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Published

2026-01-15

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Correlation between microstructure and optical transparency of PLD-derived nanostructured La₂O₃. (2026). Experimental and Theoretical NANOTECHNOLOGY, 10(1), 81-91. https://doi.org/10.56053/10.1.81